High precision control of galvanometer scanner

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DOIResolve DOI: http://doi.org/10.1117/12.967406
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TypeArticle
Proceedings titleOptomechanical Systems Engineering
Series titleProceedings of SPIE; no. 817
Conference31st Symposium on Optical Optoelectronic Science Engineering, August 16-21, 1987, San Diego, California, USA
ISSN0277-786X
1996-756X
Abstract
Publication date
PublisherSPIE
LanguageEnglish
AffiliationNRC Institute for Information Technology; National Research Council Canada
NoteMr. Blais was affiliated with the National Research Council of Canada, Division of Electronical Engineering when he authored this article.
Peer reviewedYes
NRC numberNRCC 28048
NPARC number5763989
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Record identifierfe121c89-9b75-43dc-bd43-a7d15d296e36
Record created2009-03-29
Record modified2018-10-10
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