Interfacial Analysis of n-Alkanethiol Self-assembled Monolayers on GaAs(001) by Angle-Resolved X-ray Photoelectron Spectroscopy

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TypeArticle
Proceedings titleProceedings of Surface Analysis 2012
ConferenceSurfaceAnalysis 2012: American Vacuum Society, Applied Surface Science Division Topical Conference, June 19-22, 2012, Richland, WA, U.S.A.
SubjectAngle-Resolved XPS; Alkanethiols; SAMs; Fractional overlayer; GaAs
Abstract
LanguageEnglish
AffiliationEnergy, Mining and Environment; National Research Council Canada
Peer reviewedNo
NRC numberNRC-EME-53093
NPARC number21275976
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Record identifierfd76a161-c48c-4f8f-bc48-be775e5613cf
Record created2015-08-25
Record modified2016-05-09
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