Raman microscopy mapping for the purity assessment of chirality enriched carbon nanotube networks in thin-film transistors

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DOIResolve DOI: http://doi.org/10.1007/s12274-015-0725-y
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TypeArticle
Journal titleNano Research
ISSN1998-0124
Volume8
Issue7
Pages21792187
SubjectRaman spectroscopy; carbon nanotubes; thin film transistors; microscopy mapping; purity assessment
Abstract
Publication date
PublisherSpringer International Publishing
LanguageEnglish
AffiliationNational Research Council Canada (NRC-CNRC); Security and Disruptive Technologies
Peer reviewedYes
NPARC number21275676
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Record identifierf77e41ec-42d1-48a6-9227-7600b5f4387c
Record created2015-07-14
Record modified2016-11-15
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