Comparison of the gain recovery times in low dimensional semiconductor amplifiers at 1.55 μm

DOIResolve DOI: http://doi.org/10.1109/LEOS.2006.279055
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TypeArticle
Proceedings title2006 IEEE LEOS Annual Meeting Conference Proceedings
Conference2006 IEEE LEOS Annual Meeting, October 29-November 2, 2006, Montreal, QC, Canada
ISBN0-7803-9556-5
0-7803-9555-7
Pages276277
Abstract
Publication date
PublisherIEEE
LanguageEnglish
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedYes
NPARC number23001722
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Record identifierd6d3c77f-77f3-4764-a4e7-e4fd1bb2f611
Record created2017-03-21
Record modified2017-03-21
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