Interface structure of Ge/Si superlattices determined by X-Ray absorption fine structure

Download
  1. Get@NRC: Interface structure of Ge/Si superlattices determined by X-Ray absorption fine structure (Opens in a new window)
DOIResolve DOI: http://doi.org/10.1557/PROC-220-253
AuthorSearch for: ; Search for: ; Search for: ; Search for: ; Search for: ; Search for:
TypeArticle
Journal titleMRS Proceedings
ISSN1946-4274
Volume220
Abstract
Publication date
PublisherCambridge University Press
LanguageEnglish
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedYes
NPARC number23001770
Export citationExport as RIS
Report a correctionReport a correction
Record identifierd5991414-c625-4b87-b871-77fff7517bde
Record created2017-03-31
Record modified2017-03-31
Bookmark and share
  • Share this page with Facebook (Opens in a new window)
  • Share this page with Twitter (Opens in a new window)
  • Share this page with Google+ (Opens in a new window)
Date modified: