Band gap measurement of Bi2MoxW1-xO6 by low loss electron energy loss spectroscopy

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DOIResolve DOI: http://doi.org/10.1016/j.mssp.2017.02.016
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TypeArticle
Journal titleMaterials Science in Semiconductor Processing
ISSN1369-8001
Volume63
Pages184189
Subjectelectron energy loss spectroscopy (eels); transmission electron microscopy; band gap; energy loss function; Bi2MoxW1−xO6
Abstract
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PublisherElsevier
LanguageEnglish
AffiliationNational Institute for Nanotechnology; National Research Council Canada
Peer reviewedYes
NPARC number23002387
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Record identifierbeb87cda-8af7-46b2-9c46-370523d8b87c
Record created2017-10-26
Record modified2017-10-26
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