Si/SiGe heterointerfaces in one-, two-, and three-dimensional nanostructures: their impact on SiGe light emission

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DOIResolve DOI: http://doi.org/10.3389/fmats.2016.00012
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TypeArticle
Journal titleFrontiers in Materials
ISSN2296-8016
Abstract
Publication date
LanguageEnglish
AffiliationMeasurement Science and Standards; Information and Communication Technologies; National Research Council Canada
Peer reviewedYes
NPARC number21277518
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Record identifierbe545c45-640b-411d-ab65-2cd79e2f1e0c
Record created2016-03-11
Record modified2016-05-09
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