Hafnium silicate gate insulators in field effect sensors used to detect DNA hybridization

DOIResolve DOI: http://doi.org/10.1149/1.2981149
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TypeArticle
Proceedings titleECS Transactions
Conference214th ECS Meeting, October 12-17, 2008, Honolulu, HI
Pages441450
Abstract
Publication date
PublisherECS
LanguageEnglish
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedYes
NPARC number23001041
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Record identifiera76e58e2-bd4c-436d-8680-370af96e5171
Record created2016-12-02
Record modified2016-12-02
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