Index of refraction and strain induced birefringence of pseudomorphic Si1−xGex

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DOIResolve DOI: http://doi.org/10.1557/PROC-486-101
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TypeArticle
Journal titleMRS Proceedings
ISSN1946-4274
Volume486
Abstract
Publication date
LanguageEnglish
AffiliationNRC Institute for Microstructural Sciences; National Research Council Canada
Peer reviewedYes
NPARC number21277184
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Record identifier9ca80426-651f-4ddf-a2ae-d37e3e915612
Record created2016-01-05
Record modified2016-05-09
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