Characterization of fast neutron irradiated GaAs films by photoluminescence spectroscopy

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ConferenceShallow impurities in semiconductors : proceedings of the Fourth International Conference on Shallow Impurities in Semiconductors, July 31-August 2, 1990, London, England
Pages415420; # of pages: 6
AffiliationNRC Institute for National Measurement Standards
Peer reviewedNo
NRC number1146
NPARC number5765711
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Record identifier95315903-da34-4ff0-855b-35e76d7843c1
Record created2009-03-29
Record modified2016-05-09
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