Thermal expansion coefficient measurement from electron diffraction of amorphous films in a TEM

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DOIResolve DOI: http://doi.org/10.1016/j.ultramic.2018.02.003
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TypeArticle
Journal titleUltramicroscopy
ISSN0304-3991
1879-2723
Volume188
Pages812
Abstract
Publication date
PublisherElsevier
LanguageEnglish
AffiliationNanotechnology; National Research Council Canada
Peer reviewedYes
NPARC number23002830
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Record identifier6d816a79-9d25-4897-8f88-71d8cb436176
Record created2018-03-08
Record modified2018-03-08
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