Charging of carbon thin films in scanning and phase-plate transmission electron microscopy

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1016/j.ultramic.2017.09.009
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Affiliation
  1. National Research Council of Canada. Nanotechnology
FormatText, Article
Subjectscanning transmission electron microscopy; transmission electron microscopy; electron-beam induced charging; thin film; phase plate; radiation damage; hole-free phase plate; volta phase plate
Abstract
Publication date
PublisherElsevier
In
LanguageEnglish
Peer reviewedYes
NPARC number23002641
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Record identifier60bf43bb-8525-4626-98a4-d8506d30fe51
Record created2017-12-08
Record modified2020-03-16
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