Charging of carbon thin films in scanning and phase-plate transmission electron microscopy

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DOIResolve DOI: http://doi.org/10.1016/j.ultramic.2017.09.009
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TypeArticle
Journal titleUltramicroscopy
ISSN0304-3991
Volume184
Pages252266
Subjectscanning transmission electron microscopy; transmission electron microscopy; electron-beam induced charging; thin film; phase plate; radiation damage; hole-free phase plate; volta phase plate
Abstract
Publication date
PublisherElsevier
LanguageEnglish
AffiliationNational Research Council Canada; Nanotechnology
Peer reviewedYes
NPARC number23002641
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Record identifier60bf43bb-8525-4626-98a4-d8506d30fe51
Record created2017-12-08
Record modified2017-12-08
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