| Abstract | Nanoelectronics has long striven for the ultimate limit of fabrication: reliable use of single atoms as building blocks for computational components. This has required years of development in tools not only to manipulate single atoms with sub-angstrom precision, but also tools that can read the sensitive outputs and dynamics. Here, we report the first example of reversible information transmission through an atomic silicon quantum dot fabricated binary wire and OR gate. We used an atomic force microscope operating in the non-contact regime (NC-AFM) to fabricate, read the output, and actuate both the wire and gate into different readable states. These changes are clearly seen in both raw AFM images, and in kelvin probe force microscopy (KPFM) spectroscopy taken above the silicon quantum dots. This sets the platform for a potential new class of ultra-fast, ultra-power efficient, and ultra dense computing. |
|---|
