Computer simulations analysis for determining the polarity of charge generated by high energy electron irradiation of a thin film

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DOIResolve DOI: http://doi.org/10.1016/j.micron.2017.03.015
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TypeArticle
Journal titleMicron
ISSN0968-4328
Volume100
Pages1022
Subjecthole-free phase plate; volta phase plate; radiation damage; electron beam induced charging; thon rings; fresnel images
Abstract
Publication date
LanguageEnglish
AffiliationNational Institute for Nanotechnology; National Research Council Canada
Peer reviewedYes
NPARC number23002388
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Record identifier495b88f1-4caf-48fe-84be-813576183067
Record created2017-10-26
Record modified2017-10-26
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