Versatile approach for frequency resolved wavefront characterization

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DOIResolve DOI: http://doi.org/10.1117/12.886304
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TypeArticle
Proceedings titleSPIE - International Society for Optical Engineering. Proceedings
ConferenceFrontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XI, 23 January 2011 through 26 January 2011, San Francisco, CA
ISSN0277-786X
ISBN9780819484628
Volume7925
Article number79250U
SubjectAttosecond pulse; Beam characteristics; Beam properties; Characterization techniques; Coherent radiation; Diffractograms; Electromagnetic radiation; High harmonic generation; High harmonics; Laser experiments; Molecular levels; Optical reconstruction; Oscillator amplifier; Physical process; Quantum properties; Spatial characterization; Spectral region; Temporal profile; wavefront sensing; X-ray free electron lasers; Xuv radiation; Diffraction patterns; Electromagnetic waves; Electron optics; Free electron lasers; Harmonic analysis; Harmonic generation; Industrial applications; Interferometry; Lasers; Wavefronts
Abstract
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LanguageEnglish
AffiliationNational Research Council Canada
Peer reviewedYes
NPARC number21276166
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Record identifier4646dfa6-c8fd-4da9-a6af-fbe47f82e702
Record created2015-09-28
Record modified2017-04-24
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