Quality evaluation of ultra-thin samples: application to graphene

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DOIResolve DOI: http://doi.org/10.1002/jemt.22869
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TypeArticle
Journal titleMicroscopy Research and Technique
ISSN1059-910X
1097-0029
Volume80
Issue8
Pages823830
Abstract
Publication date
PublisherWiley
LanguageEnglish
AffiliationNational Institute for Nanotechnology; National Research Council Canada
Peer reviewedYes
NPARC number23002390
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Record identifier4214584e-afb9-48e4-a521-bbff20df5ef8
Record created2017-10-26
Record modified2017-10-26
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