Critical Factors and Configurations for Practical 3D Image-Based Modeling

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Conference6th Conference on 3D Measurement Techniques, September 22-25, 2003., Zurich, Switzerland
Subject3D modeling; evaluation; simulations; configurations; accuracy; uncertainty; évaluation; simulations; configurations; exactitude; incertitude
Publication date
AffiliationNRC Institute for Information Technology; National Research Council Canada
Peer reviewedNo
NRC number46554
NPARC number8914375
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Record identifier3c6626ee-63bb-4d53-bf41-8fca0404cbbb
Record created2009-04-22
Record modified2016-05-09
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