Measuring to Fit: Virtual Tailoring through Cluster Analysis and Classification

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TypeArticle
ConferenceThe 17th International European Conference on Machine Learning and the 10th European Conference on Principles and Practice of Knowledge Discovery in Databases (ECML/PKDD 2006), September 18-22, 2006., Berlin, Germany
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LanguageEnglish
AffiliationNRC Institute for Information Technology; National Research Council Canada
Peer reviewedNo
NRC number48749
NPARC number5764813
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Record identifier24ec87c1-576b-4774-a926-b59c7188c80c
Record created2009-03-29
Record modified2016-05-09
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