| Abstract | Growth and thermal behavior of copper-phthalocyanine (CuPc) and fullerene (C60) organic nanocomposite thin films, grown on SiO2 and Cu(111) surfaces, have been studied using scanning electron microscopy, X-ray diffraction (XRD) and scanning tunneling microscopy (STM). It is found that the growth of pure CuPc organic thin films follows an island-type growth mode. The island formation is found to be dramatically suppressed by the inclusion of C60 during deposition. XRD and STM studies reveal that the CuPc molecular packing is altered upon C60 inclusion, producing disordered CuPc-C60 interfaces. The ordered molecular stacking of CuPc is found to be disrupted completely when C60 concentration reaches 30wt.%. The thermal stability of the CuPc thin film has been significantly improved upon C60 inclusion. It is suggested that the molecular diffusion kinetics rather than thermodynamics are responsible for the improved stability. |
|---|
