Some Solutions to Vision Dimensional Metrology Problems

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ConferenceSPIE Proceedings, Close-Range Photogrammetry Meets Machine Vision, September 3-7, 1990., Zurich, Switzerland
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AffiliationNRC Institute for Information Technology; National Research Council Canada
Peer reviewedNo
NRC number32232
NPARC number8914443
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Record identifier08a191c0-2c8b-4f6a-9f9c-3363edfaa6b2
Record created2009-04-22
Record modified2016-05-09
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