| DOI | Trouver le DOI : https://doi.org/10.1557/PROC-401-339 |
|---|
| Auteur | Rechercher : Denhoff, Michael1; Rechercher : Mason, B.1; Rechercher : Tran, Hue1; Rechercher : Grant, Peter1 |
|---|
| Affiliation | - Conseil national de recherches du Canada. Institut des sciences des microstructures du CNRC
|
|---|
| Format | Texte, Article |
|---|
| Conférence | 1995 MRS Fall Meeting: Symposium G: Epitaxial Oxide Thin Films II, November 26-30, 1995, Boston, Massachusetts, U.S.A. |
|---|
| Résumé | The structure of CeO2 films grown on (1102) sapphire and on YBCO thin films was investigated. The films reported on here were grown by pulsed excimer laser deposition and their surface structure was probed using atomic force microscopy. We found that CeO2 films grown on sapphire were epitaxial with a granular structure which is smooth on an atomic scale. We see evidence of a surface reconstruction on a very smooth CeO2 (100) oriented surface. At higher growth temperatures, three dimensional islands begin to form. When a CeO2 film is grown on top of a YBCO film, the growth mode is two dimensional. The steps in this layer by layer growth are a surprisingly large 2 nm. This is about equal to 4 times the CeO2 lattice constant. This step height appears to be temperature dependent. |
|---|
| Date de publication | 1996 |
|---|
| Dans | |
|---|
| Série | |
|---|
| Note | yes |
|---|
| Numéro NPARC | 12338400 |
|---|
| Exporter la notice | Exporter en format RIS |
|---|
| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
|---|
| Identificateur de l’enregistrement | ae62cea5-9227-4675-b601-67023c26a44b |
|---|
| Enregistrement créé | 2009-09-10 |
|---|
| Enregistrement modifié | 2020-03-20 |
|---|
