| DOI | Trouver le DOI : https://doi.org/10.1016/j.micron.2005.11.005 |
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| Auteur | Rechercher : Egerton, R. F.1; Rechercher : Qian, H.1; Rechercher : Malac, M.1 |
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| Affiliation | - Conseil national de recherches du Canada. Institut national de nanotechnologie
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| Format | Texte, Article |
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| Sujet | EELS; energy resolution; maximum entropy; maximum likelihood; monochromator |
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| Résumé | We discuss some practical problems of improving the resolution of X-ray and electron spectra. Iterative Bayesian methods promise greater resolution enhancement than Fourier techniques but they also give rise to spectral artifacts. Satellite peaks are generated adjacent to strong peaks in the original spectrum and oscillatory artifacts become prominent after a large number of iterations, particularly when the original data contain high noise content. In the case of valence-electron energy-loss spectra, satellite peaks are reduced by removing the zero-loss peak prior to spectral sharpening. Even so, care should be exercised in interpreting low intensity at low energy loss (after sharpening) as evidence for a bandgap in the electronic density of states. |
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| Date de publication | 2006-06 |
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| Dans | |
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| Langue | anglais |
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| Publications évaluées par des pairs | Oui |
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| Numéro NPARC | 12339094 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | a50a9eb1-5e97-46ed-aae5-dae3658844e5 |
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| Enregistrement créé | 2009-09-11 |
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| Enregistrement modifié | 2020-04-22 |
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