DOI | Trouver le DOI : https://doi.org/10.1109/LPT.2011.2161866 |
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Auteur | Rechercher : Ortega-Moñux, A.; Rechercher : Zavargo-Peche, L.; Rechercher : Maese-Novo, A.; Rechercher : Molina-Fernández, I.; Rechercher : Halir, R.; Rechercher : Wangüemert-Pérez, J.G.; Rechercher : Cheben, P.1Identifiant ORCID : https://orcid.org/0000-0003-4232-9130; Rechercher : Schmid, J.H.1 |
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Affiliation | - Conseil national de recherches du Canada. Institut des sciences des microstructures du CNRC
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Format | Texte, Article |
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Sujet | common mode rejection ratio; complex devices; index contrasts; multimode interference couplers; phase error; silicon waveguide; silicon wire waveguide; silicon-on-insulators; single etch; sub-wavelength; sub-wavelength structures; subwavelength grating; refractive index; waveguide couplers; waveguides; integrated optics |
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Résumé | The performance of multimode interference (MMI) couplers in silicon waveguides is limited by the high lateral refractive index contrast. Here we propose the use of subwavelength gratings (SWGs) in the lateral cladding regions of the MMI to reduce the index contrast. Our approach significantly reduces the mode phase error while at the same time allowing a single etch step process. Using a $z$-periodic lateral SWG, we design a 2 × 4 MMI that operates as a 90° hybrid for a coherent optical receiver. This complex device exhibits a common mode rejection ratio (CMRR) and a phase error of less than-24 dBe and 2°, respectively, over the full C-band. Compared to MMI with a homogenous lateral cladding, using subwavelength refractive index engineering effectively extends the receiver bandwidth from 36 to 60 nm. © 2011 IEEE. |
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Date de publication | 2011 |
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Dans | |
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Langue | anglais |
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Publications évaluées par des pairs | Oui |
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Numéro NPARC | 21271504 |
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Exporter la notice | Exporter en format RIS |
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Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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Identificateur de l’enregistrement | 511bd91e-b131-454f-9a5c-e1d71ab156fa |
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Enregistrement créé | 2014-03-24 |
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Enregistrement modifié | 2020-04-21 |
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