DOI | Trouver le DOI : https://doi.org/10.1146/annurev-anchem-061010-113847 |
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Auteur | Rechercher : Bergren, A.J.1; Rechercher : McCreery, R.L. |
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Affiliation | - Conseil national de recherches du Canada. Institut national de nanotechnologie
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Format | Texte, Article |
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Sujet | Analytical characterization; Analytical method; Buried interface; Device operations; Molecular electronic device; Molecular junction; Molecular layer; Semiconductive; Molecular electronics; Self assembly; Chemical analysis |
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Résumé | This review discusses the analytical characterization of molecular electronic devices and structures relevant thereto. In particular, we outline the methods for probing molecular junctions, which contain an ensemble of molecules between two contacts. We discuss the analytical methods that aid in the fabrication and characterization of molecular junctions, beginning with the confirmation of the placement of a molecular layer on a conductive or semiconductive substrate. We emphasize methods that provide information about the molecular layer in the junction and outline techniques to ensure molecular layer integrity after the complete fabrication of a device. In addition, we discuss the analytical information derived during the actual device operation. Copyright © 2011 by Annual Reviews. All rights reserved. |
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Date de publication | 2011 |
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Dans | |
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Langue | anglais |
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Publications évaluées par des pairs | Oui |
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Numéro NPARC | 21271168 |
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Exporter la notice | Exporter en format RIS |
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Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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Identificateur de l’enregistrement | 399cc847-c169-43e8-8796-e5ee7f570bcd |
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Enregistrement créé | 2014-03-24 |
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Enregistrement modifié | 2020-04-21 |
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