| Téléchargement | - Voir la version finale : An interferometer for thin film measurement (PDF, 1.4 Mio)
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| DOI | Trouver le DOI : https://doi.org/10.4224/21274737 |
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| Auteur | Rechercher : Wilkinson, R.L.1 |
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| Affiliation | - Conseil national de recherches du Canada
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| Format | Texte, Rapport technique |
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| Description physique | 17 p. |
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| Sujet | film; interferometer |
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| Résumé | The multiple-beam interferometer described here is intended to measure the thickness of evaporated films whose thickness is in the order of 1000 A. The accuracy of these measurements is ± 2%. The multiple-beam principle is outlined followed by a consideration of the design steps including choice of air wedge angle and thickness, microscope objective, degree of collimation. The completed interferometer is described with proposed improvements. |
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| Date de publication | 1968-01 |
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| Maison d’édition | National Research Council of Canada. Radio and Electrical Engineering Division |
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| Série | |
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| Langue | anglais |
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| Numéro NPARC | 21274737 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | 36b98901-05f8-4f3c-9527-fa8dca25270e |
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| Enregistrement créé | 2015-03-31 |
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| Enregistrement modifié | 2023-01-25 |
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