| DOI | Trouver le DOI : https://doi.org/10.1063/1.111081 |
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| Auteur | Rechercher : Aers, G. C.1 |
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| Affiliation | - Conseil national de recherches du Canada. Institut des sciences des microstructures du CNRC
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| Format | Texte, Article |
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| Sujet | algorithms; backscattering; crystal defects; data analysis; depth profiles; interfaces; monte carlo method; multilayers; positron probes; scaling laws; scattering theory; stopping power |
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| Résumé | Using a simple model to take into account the backscattering effects of interfaces we have developed a scheme which removes the necessity for time-consuming Monte Carlo calculations in the generation of positron stopping profiles in multilayer systems. This scheme uses tabulated mean depth and backscattering fraction data for positrons in the materials constituting the multilayer and represents a computation time saving of several orders of magnitude. This makes detailed multilayer defect profiling with positrons a practical possibility. |
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| Date de publication | 1994-01-31 |
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| Dans | |
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| Langue | anglais |
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| Numéro NPARC | 12328818 |
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| Exporter la notice | Exporter en format RIS |
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| Signaler une correction | Signaler une correction (s'ouvre dans un nouvel onglet) |
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| Identificateur de l’enregistrement | 1172e6b7-c683-4b70-9362-118869adb9df |
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| Enregistrement créé | 2009-09-10 |
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| Enregistrement modifié | 2020-04-27 |
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