The surface topography of cracks in strained In0.72Ga0.28P films
The surface topography of cracks in strained In0.72Ga0.28P films
| Download | |
|---|---|
| DOI | Resolve DOI: https://doi.org/10.1080/09500830050110468 |
| Author | Search for: ; Search for: |
| Format | Text, Article |
| Publication date | 2000 |
| In | |
| NPARC number | 12744241 |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | f8cfdd04-53da-41ae-ace2-4aa63a2f0883 |
| Record created | 2009-10-27 |
| Record modified | 2020-03-26 |
- Date modified: