Spatially resolved characterization of interface plasmons in Si/SiO2 core/shell nanostructures
Spatially resolved characterization of interface plasmons in Si/SiO2 core/shell nanostructures
DOI | Resolve DOI: https://doi.org/10.1017/S143192760909401X |
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Affiliation |
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Format | Text, Article |
Conference | Microscopy and Microanalysis 2009, 26-30 July 2009, Richmond, Virginia, USA |
Publication date | 2009-07-29 |
In | |
Language | English |
Peer reviewed | Yes |
NPARC number | 19739577 |
Export citation | Export as RIS |
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Record identifier | f1181c9b-e188-4c13-bd11-1c1a9b95d5f2 |
Record created | 2012-04-02 |
Record modified | 2020-04-16 |
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