| Download | - View accepted manuscript: Structural Characterization of a Coarsegrained Transparent Silicon Carbide Powder by a Combination of Powder Diffraction Techniques (PDF, 746 KiB)
|
|---|
| DOI | Resolve DOI: https://doi.org/10.1524/zksu.2009.0009 |
|---|
| Author | Search for: Peplinski, B.; Search for: Fitch, A. N.; Search for: Evans, A.; Search for: Ibberson, R. M.; Search for: Többens, D. M.; Search for: Cranswick, L. M. D.1; Search for: Dörfel, I.; Search for: Emmerling, F.; Search for: Matschat, R. |
|---|
| Affiliation | - National Research Council of Canada. NRC Canadian Neutron Beam Centre
|
|---|
| Format | Text, Article |
|---|
| Abstract | Diffraction of hard synchrotron radiation as well as constant-wavelength and time-of-flight neutron diffraction were used for the structural characterization of a silicon carbide powder having extremely low levels of chemical impurities, high perfection of the crystalline lattice and a grain size of up to 150 μm. The presence of three polytypes was ascertained and the ratios of their mass fractions were determined to be w15R : w6H = 0.002,3(8) and w4H : w6H = 0.000,6(2). |
|---|
| Publication date | 2009-09-01 |
|---|
| In | |
|---|
| Language | English |
|---|
| Peer reviewed | Yes |
|---|
| NPARC number | 14791390 |
|---|
| Export citation | Export as RIS |
|---|
| Report a correction | Report a correction (opens in a new tab) |
|---|
| Record identifier | f0b4230c-2863-4b91-b057-0a4ecdb71578 |
|---|
| Record created | 2011-02-15 |
|---|
| Record modified | 2020-04-16 |
|---|
