XAFS and X-ray Reflectivity Study of III-V Compound Native Oxide/GaAs Interfaces
XAFS and X-ray Reflectivity Study of III-V Compound Native Oxide/GaAs Interfaces
DOI | Resolve DOI: https://doi.org/10.1107/S0909049501001248 |
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Format | Text, Article |
Publication date | 2001 |
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NPARC number | 12743780 |
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Record identifier | e223db3c-af86-4bec-bb83-606a8e4af928 |
Record created | 2009-10-27 |
Record modified | 2020-03-27 |
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