Thermal Oxidation of III-V Semiconductors for Device Alications

From National Research Council Canada

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Affiliation
  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
  2. National Research Council of Canada. NRC Institute for National Measurement Standards
FormatText, Article
ConferenceInt Sym on High Temperature Corrosion and Protection 2000, September 2000, Hokkaido, Japan
NPARC number12346212
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Record identifiere13178a5-fe81-4920-beb5-1c9408e38556
Record created2009-09-17
Record modified2020-04-16
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