| Download | - View accepted manuscript: Pattern Replication of 100 nm to Millimeter-Scale Features by Thermal Nanoimprint Lithography (PDF, 698 KiB)
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| Author | Search for: Cui, Bo1; Search for: Veres, Teodor1 |
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| Affiliation | - National Research Council of Canada. NRC Industrial Materials Institute
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| Format | Text, Article |
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| Conference | The 1st International Conference on Micro- and Nano-Technology (Viennano ’05), Vienna, Austria, March 09-11, 2005 |
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| Publication date | 2005 |
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| In | |
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| Language | English |
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| Peer reviewed | No |
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| NRC number | NRCC 48971 |
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| NPARC number | 15966890 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | da483fb4-363a-4d29-8162-aa5d77d4260d |
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| Record created | 2010-11-02 |
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| Record modified | 2020-04-07 |
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