ADF-STEM imaging of strained GaN0045As0955 epitaxial layers on 100 GaAs substrates
ADF-STEM imaging of strained GaN0045As0955 epitaxial layers on 100 GaAs substrates
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Format | Text, Article |
Conference | Mater Res Soc Sym |
NPARC number | 12346425 |
Export citation | Export as RIS |
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Record identifier | c0eb470e-78b9-44e3-8a1e-c791c9c6c7f4 |
Record created | 2009-09-17 |
Record modified | 2020-04-16 |
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