| DOI | Resolve DOI: https://doi.org/10.1016/j.apsusc.2014.01.173 |
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| Author | Search for: Vesa, C.1; Search for: Urban, R.1; Search for: Pitters, J.L.1; Search for: Wolkow, R.A.1 |
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| Affiliation | - National Research Council of Canada. National Institute for Nanotechnology
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| Format | Text, Article |
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| Subject | Experiments; Gas industry; Ion sources; Nitrogen; Single crystals; Faceting; Field ion microscopy; Gas assisted etchings; Gas field ion sources; Single atoms; Atoms |
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| Abstract | Experiments aimed at assessing the robustness of nitrogen-etched, single-atom tips (SATs) prepared using W(1 1 1) single crystal wire were performed. Our experiments showed that single-atoms tips sustain minimal damage when exposed to atmospheric conditions and can be readily and quickly nitrogen-etched to single-atom tips thereafter. The SATs can be annealed at temperatures up to 1100 C with minimal shape changes. Moreover, annealing temperatures in excess of 1200 C resulted in an apex faceting which may prove important in further single-atom tip creation. Procedures for warming of the SATs from operating temperatures of 80 K were also evaluated to determine conditions that limit tip contamination. These results show that SATS could be fabricated in a dedicated vacuum system and subsequently transferred to other instruments where they would undergo a brief conditioning procedure to recover the single-atom apex configuration prior to being subjected to operating conditions.. © 2014 Elsevier B.V. |
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| Publication date | 2014 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 21272142 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | bf85b05e-65a5-49d4-9f02-ed0535b49a32 |
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| Record created | 2014-07-23 |
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| Record modified | 2020-04-22 |
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