Electrical Characterization and Surface Morphology of Optimized Ti/Al/Ti/Au Ohmic Contacts for AlGaN/GaN HEMTs

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1149/1.2206998
AuthorSearch for: 1; Search for: 1; Search for: 1; Search for:
Affiliation
  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
FormatText, Article
Publication date
In
NPARC number12744706
Export citationExport as RIS
Report a correctionReport a correction (opens in a new tab)
Record identifierb804ce82-6f77-4019-b809-be6ca2856bfe
Record created2009-10-27
Record modified2020-04-22
Date modified: