Electrical Characterization and Surface Morphology of Optimized Ti/Al/Ti/Au Ohmic Contacts for AlGaN/GaN HEMTs
Electrical Characterization and Surface Morphology of Optimized Ti/Al/Ti/Au Ohmic Contacts for AlGaN/GaN HEMTs
DOI | Resolve DOI: https://doi.org/10.1149/1.2206998 |
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Author | Search for: 1; Search for: 1; Search for: 1; Search for: |
Affiliation |
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Format | Text, Article |
Publication date | 2006 |
In | |
NPARC number | 12744706 |
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Record identifier | b804ce82-6f77-4019-b809-be6ca2856bfe |
Record created | 2009-10-27 |
Record modified | 2020-04-22 |
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