High resolution cold field emission scanning electron microscopy of cements

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Conference29th International Cement Microscopy Association Conference: 21 May 2007, Québec City
Pages472489; # of pages: 18
AbstractThis paper discusses the use of the cold field emission scanning electron microscope (CFE-SEM) for tricalcium silicate and ordinary Portland cement microscopy, with an emphasis on both the early stages of cement hydration and unhydrated samples. The recent discovery of nanoscale structures formed at the end of the induction period is described. CFE-SEMs are capable of operating at very low accelerating voltages and can thus produce very high magnification images without requiring coating of samples.
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AffiliationNRC Institute for Research in Construction; National Research Council Canada
Peer reviewedYes
NRC number49476
NPARC number20377520
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Record identifierb6432284-03d9-4295-b191-1616e72e1361
Record created2012-07-24
Record modified2016-05-09
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