Author | Search for: Hinzer, K.; Search for: Hawrylak, Pawel1; Search for: Korkunsinski, M.; Search for: McCaffrey, John2; Search for: Wasilewski, Zbigniew1; Search for: Fafard, S.; Search for: Bayer, M.; Search for: Stern, O.; Search for: Forchel, A. |
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Affiliation | - National Research Council of Canada. NRC Institute for Microstructural Sciences
- National Research Council of Canada. NRC Institute for National Measurement Standards
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Format | Text, Article |
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Conference | 25th International Conference on the Physics of Semiconductors, 17-22 September 2000, Osaka, Japan |
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Language | English |
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NPARC number | 12346717 |
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Export citation | Export as RIS |
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Report a correction | Report a correction (opens in a new tab) |
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Record identifier | ae946339-891f-433e-82c0-00240163b16a |
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Record created | 2009-09-17 |
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Record modified | 2020-04-16 |
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