| DOI | Resolve DOI: https://doi.org/10.1557/PROC-401-339 |
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| Author | Search for: Denhoff, Michael1; Search for: Mason, B.1; Search for: Tran, Hue1; Search for: Grant, Peter1 |
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| Affiliation | - National Research Council of Canada. NRC Institute for Microstructural Sciences
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| Format | Text, Article |
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| Conference | 1995 MRS Fall Meeting: Symposium G: Epitaxial Oxide Thin Films II, November 26-30, 1995, Boston, Massachusetts, U.S.A. |
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| Abstract | The structure of CeO2 films grown on (1102) sapphire and on YBCO thin films was investigated. The films reported on here were grown by pulsed excimer laser deposition and their surface structure was probed using atomic force microscopy. We found that CeO2 films grown on sapphire were epitaxial with a granular structure which is smooth on an atomic scale. We see evidence of a surface reconstruction on a very smooth CeO2 (100) oriented surface. At higher growth temperatures, three dimensional islands begin to form. When a CeO2 film is grown on top of a YBCO film, the growth mode is two dimensional. The steps in this layer by layer growth are a surprisingly large 2 nm. This is about equal to 4 times the CeO2 lattice constant. This step height appears to be temperature dependent. |
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| Publication date | 1996 |
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| Note | yes |
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| NPARC number | 12338400 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | ae62cea5-9227-4675-b601-67023c26a44b |
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| Record created | 2009-09-10 |
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| Record modified | 2020-03-20 |
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