| Download | - View accepted manuscript: Charge trapping in and electrical properties of pulsed laser deposited Sm2O3 films (PDF, 228 KiB)
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| DOI | Resolve DOI: https://doi.org/10.1063/1.1569660 |
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| Author | Search for: Yang, Dongfang1; Search for: Xue, Lijue1; Search for: Devine, R.A.B. |
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| Affiliation | - National Research Council of Canada. NRC Industrial Materials Institute
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| Format | Text, Article |
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| Subject | electrical properties; pulsed laser deposition; pulsed lasers; thin films; dielectric constant |
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| Abstract | The electrical properties of pulsed laser deposited Sm2O3 films have been studied. The dielectric constants are 9.6 and 12.8 for samples deposited at 400 and 683 °C, respectively. The presence of substantial densities of mobile positive charge and significant negative charge trapping has been evidenced. The leakage current densities are, typically, 10−4 A cm−2 for electric fields∼0.24 MV cm−1. |
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| Publication date | 2003-05-19 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 21272524 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | a749a7d6-bb84-4372-a621-da7f78b7b910 |
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| Record created | 2014-12-01 |
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| Record modified | 2021-12-07 |
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