| DOI | Resolve DOI: https://doi.org/10.1016/j.micron.2005.11.005 |
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| Author | Search for: Egerton, R. F.1; Search for: Qian, H.1; Search for: Malac, M.1 |
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| Affiliation | - National Research Council of Canada. National Institute for Nanotechnology
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| Format | Text, Article |
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| Subject | EELS; energy resolution; maximum entropy; maximum likelihood; monochromator |
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| Abstract | We discuss some practical problems of improving the resolution of X-ray and electron spectra. Iterative Bayesian methods promise greater resolution enhancement than Fourier techniques but they also give rise to spectral artifacts. Satellite peaks are generated adjacent to strong peaks in the original spectrum and oscillatory artifacts become prominent after a large number of iterations, particularly when the original data contain high noise content. In the case of valence-electron energy-loss spectra, satellite peaks are reduced by removing the zero-loss peak prior to spectral sharpening. Even so, care should be exercised in interpreting low intensity at low energy loss (after sharpening) as evidence for a bandgap in the electronic density of states. |
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| Publication date | 2006-06 |
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| In | |
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| Language | English |
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| Peer reviewed | Yes |
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| NPARC number | 12339094 |
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| Export citation | Export as RIS |
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| Report a correction | Report a correction (opens in a new tab) |
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| Record identifier | a50a9eb1-5e97-46ed-aae5-dae3658844e5 |
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| Record created | 2009-09-11 |
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| Record modified | 2020-04-22 |
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