DOI | Resolve DOI: https://doi.org/10.1103/PhysRevLett.112.246802 |
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Author | Search for: Martins, B.V.C.1; Search for: Smeu, M.; Search for: Livadaru, L.; Search for: Guo, H.; Search for: Wolkow, R.A.1 |
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Affiliation | - National Research Council of Canada. National Institute for Nanotechnology
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Format | Text, Article |
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Subject | Quantum electronics; Conducting surfaces; First-principles quantum transports; Intrinsic conductivity; Minimal interactions; Orders of magnitude; Per unit length; Surface conductivity; Transport method; Silicon |
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Abstract | While it is known that the Si-(7×7) is a conducting surface, measured conductivity values differ by 7 orders of magnitude. Here we report a combined STM and transport method capable of surface conductivity measurement of step-free or single-step containing surface regions and having minimal interaction with the sample, and by which we quantitatively determine the intrinsic conductivity of the Si-(7×7) surface. We found that a single step has a conductivity per unit length about 50 times smaller than the flat surface. Our first principles quantum transport calculations confirm and lend insight into the experimental observation. © 2014 American Physical Society. |
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Publication date | 2014 |
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In | |
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Language | English |
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Peer reviewed | Yes |
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NPARC number | 21272177 |
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Export citation | Export as RIS |
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Report a correction | Report a correction (opens in a new tab) |
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Record identifier | a3f76804-3dbc-409f-8f76-1273efacdbb0 |
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Record created | 2014-07-23 |
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Record modified | 2020-04-22 |
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