A UHV deposition/reflectometer system for the deposition and characterization of XUV multilayer mirrors
A UHV deposition/reflectometer system for the deposition and characterization of XUV multilayer mirrors
Author | Search for: 1 |
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Affiliation |
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Format | Text, Thesis |
Publisher | Université du Québec, INRS |
Language | English |
NPARC number | 12339150 |
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Record identifier | 891973f1-cc4f-49e4-a7e4-3171835f0ef4 |
Record created | 2009-09-11 |
Record modified | 2023-03-22 |
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