Residual stress development in UMS TiN coatings
Residual stress development in UMS TiN coatings
Author | Search for: 1; Search for: 1 |
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Affiliation |
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Format | Text, Article |
Conference | International Conference on Metallurgical Coatings and Thin Films From 5/2/2005 To 5/6/2005, San Diego/ USA |
Subject | Magnetron Sputtering; Titanium Nitride; Residual Stress; Microstructural Properties; Mechanical Properties |
Access condition |
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Peer reviewed | Yes |
NRC number | SMPL-2004-0213 |
NPARC number | 8932561 |
Export citation | Export as RIS |
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Record identifier | 83f4e2ed-ff30-4aed-8a2e-c43aa6963c2a |
Record created | 2009-04-23 |
Record modified | 2020-04-16 |
- Date modified: