DOI | Resolve DOI: https://doi.org/10.1109/Group4.2013.6644476 |
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Author | Search for: Halir, R.; Search for: Ortega-Moñux, A.; Search for: Maese-Novo, A.; Search for: Pérez-Galacho, D.; Search for: Zavargo-Peche, L.; Search for: Molina-Fernández, I.; Search for: Pérez, J.G.W.; Search for: Cheben, P.1ORCID identifier: https://orcid.org/0000-0003-4232-9130; Search for: Schmid, J.H.1; Search for: Xu, D.-X.1; Search for: Janz, S.1; Search for: Fédéli, J.-M. |
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Affiliation | - National Research Council of Canada. NRC Institute for Microstructural Sciences
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Format | Text, Article |
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Conference | 2013 IEEE 10th International Conference on Group IV Photonics, GFP 2013, 28 August 2013 through 30 August 2013, Seoul |
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Subject | degree of freedom; diffraction effects; dispersion engineering; multimode interference couplers; sub-wave length grating; sub-wavelength structures; ultra-broadband; waveguiding structures; dispersion (waves); dispersions; photonics; silicon; refractive index |
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Abstract | In most integrated optics platforms, including silicon-on-insulator, only minor modifications in refractive index are possible. The geometry of the waveguiding structure is thus the only degree of freedom for the design of devices. The use of sub-wavelength gratings (SWGs), i.e. structures that are small enough to suppress diffraction effects, enables local engineering of both refractive index and dispersion, thereby opening new possibilities for device design. Here we present some of the recent advances in refractive index and dispersion engineering using silicon SWGs, focussing on ultra-broadband and compact multimode interference couplers and directional couplers. © 2013 IEEE. |
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Publication date | 2013 |
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In | |
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Language | English |
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Peer reviewed | Yes |
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NPARC number | 21270945 |
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Export citation | Export as RIS |
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Report a correction | Report a correction (opens in a new tab) |
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Record identifier | 7f2c0f52-495f-4a3c-8c5e-041b6f8f4f5e |
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Record created | 2014-02-18 |
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Record modified | 2020-04-22 |
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