Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy

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DOIResolve DOI: https://doi.org/10.1073/pnas.0912716107
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  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
FormatText, Article
Subjectnanoelectronics; single-electron charging; shell structure; electrostatic force microscopy
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LanguageEnglish
Peer reviewedYes
NPARC number17401041
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Record identifier7211deb8-99d2-4103-8cdb-4356e22415d1
Record created2011-03-29
Record modified2020-04-17
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