Polarized Raman scattering and localized embedded strain in self-organized Si/Ge nano-structures

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1063/1.1628403
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Affiliation
  1. National Research Council of Canada. NRC Institute for Microstructural Sciences
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LanguageEnglish
Peer reviewedYes
NPARC number12744738
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Record identifier5e8604ca-e7de-44d9-a77b-b37f7ea98aff
Record created2009-10-27
Record modified2023-05-10
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