Transmission electron microscopy characterization of InAlSb/InSb bilayers and superlattices

From National Research Council Canada

DOIResolve DOI: https://doi.org/10.1016/S0968-4328(96)00048-0
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Affiliation
  1. National Research Council of Canada. NRC Institute for Fuel Cell Innovation
  2. National Research Council of Canada. NRC Steacie Institute for Molecular Sciences
FormatText, Article
Subjectbilayer; crystal growth; diffraction contrast; electron diffraction; electron microscopy; high resolution; InAlSb; InSb; magnetron sputter epitaxy; semiconductor; superlattice
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NPARC number12327315
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Record identifier59b66e27-c422-4e43-9940-cf0b51cab5e2
Record created2009-09-10
Record modified2020-03-20
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