EELS in the TEM

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Journal titleJournal of Electron Spectroscopy and Related Phenomena
Pages4350; # of pages: 8
SubjectEELS; ELNES; radiation damage; spectrometers; TEM
AbstractThis review deals with the spectroscopy of the electrons that have passed through a thin sample in a transmission electron microscope. Many of these electrons undergo inelastic scattering and their energy loss provides information about the chemical and structural properties of the specimen. The instrumentation required for EELS and energy-filtered imaging is described, together with the features found in a typical energy-loss spectrum. Examples are given of practical applications of plasmon-loss and core-loss spectroscopy, as well as energy-filtered imaging. Finally, EELS is compared with other spectroscopic techniques in terms of range of application, sensitivity, spatial resolution and radiation damage.
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This is a non-NRC publication

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NPARC number12338539
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Record identifier4b07df07-4b37-492a-aeee-cbdd2bd35e92
Record created2009-09-10
Record modified2016-05-09
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