Structural characterization of stable amorphous silicon films
Structural characterization of stable amorphous silicon films
| DOI | Resolve DOI: https://doi.org/10.1016/S0038-1098(02)00123-0 |
|---|---|
| Author | Search for: ; Search for: ; Search for: ; Search for: ; Search for: |
| Format | Text, Article |
| Publication date | 2002 |
| In | |
| NPARC number | 12744583 |
| Export citation | Export as RIS |
| Report a correction | Report a correction (opens in a new tab) |
| Record identifier | 4ab4f4df-afa7-447f-9646-41d7eb620cfa |
| Record created | 2009-10-27 |
| Record modified | 2020-03-30 |
- Date modified: