Scattering lifetimes due to interface roughness with large lateral correlation length in a Al1-xGaxN/GaN two-dimensional electron gas
Scattering lifetimes due to interface roughness with large lateral correlation length in a Al1-xGaxN/GaN two-dimensional electron gas
DOI | Resolve DOI: https://doi.org/10.1103/PhysRevB.66.245305 |
---|---|
Author | Search for: 1; Search for: 2; Search for: ; Search for: 1; Search for: ; Search for: ; Search for: 1 |
Affiliation |
|
Format | Text, Article |
Publication date | 2002 |
In | |
Language | English |
Peer reviewed | Yes |
NPARC number | 12327945 |
Export citation | Export as RIS |
Report a correction | Report a correction (opens in a new tab) |
Record identifier | 49c5cd04-bebb-4821-a90f-49e4ccb0bc2a |
Record created | 2009-09-10 |
Record modified | 2020-04-06 |
- Date modified: